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SUMMARY
The aim of this project is to carry out research in the testing, diagnostics analysis, and fault tolerance of embedded systems and their components in line with International Technology Roadmap for Semiconductors. Ultimately, the team seeks to advance the reliability of new design paradigms new design paradigms such network-on-chips and ubiquitous and massively parallel computing,
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SOLUTIONS
- Targeting the modelling and synthesis, verification and debugging, test generation and simulation, self-test capability, diagnosis, defect analysis and fault tolerance of modern embedded systems
- Finding suitable integrated methodologies for developing reliable applications out of non-reliable circuits
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